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Browsing Research Articles (Physics) by UP Author "Omotoso, Ezekiel"
Now showing items 1-20 of 23
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Igumbor, Emmanuel; Omotoso, Ezekiel; Meyer, Walter Ernst (Trans Tech Publications, 2017-06)We present results of defect formation energies and charge state thermodynamic transition levels of Mg and Te interstitials in MgTe wurzite structure. We use the generalized gradient approximation and local density ...
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Ngoepe, Phuti Ngako Mahloka; Meyer, Walter Ernst; Auret, Francois Danie; Omotoso, Ezekiel; Hlatshwayo, Thulani Thokozani; Diale, M. (Mmantsae Moche) (Elsevier, 2018-04)Deep level transient spectroscopy (DLTS) was used to characterise Cs implanted GaN grown by hydride vapour phase epitaxy (HVPE). This implantation was done at room temperature using energy of 360 keV to a fluence of 10–11 ...
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Ngoepe, Phuti Ngako Mahloka; Meyer, Walter Ernst; Auret, Francois Danie; Omotoso, Ezekiel; Diale, M. (Mmantsae Moche); Swart, H.C.; Duvenhage, M.M.; Coetsee, E. (Elsevier, 2016-01)The evolution of Ni/Au and Ni/Ir/Au metal contacts deposited on AlGaN was investigated at different annealing temperatures. The samples were studied with electrical and chemical composition techniques. I-V characteristics ...
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Gora, V.E.; Chawanda, A.; Nyamhere, C.; Auret, Francois Danie; Mazunga, F.; Jaure, T.; Chibaya, B.; Omotoso, Ezekiel; Danga, Helga Tariro; Tunhuma, Shandirai Malven (Elsevier, 2018-04)We have investigated the current-voltage (I-V) characteristics of nickel (Ni), cobalt (Co), tungsten (W) and palladium (Pd) Schottky contacts on n-type 4H-SiC in the 300–800 K temperature range. Results extracted from I-V ...
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Igumbor, Emmanuel; Danga, Helga Tariro; Omotoso, Ezekiel; Meyer, Walter Ernst (Elsevier, 2019-03)Please read abstract in the article.
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Omotoso, Ezekiel; Paradzah, Alexander Tapera; Igumbor, E.; Taleatu, B.A.; Meyer, Walter Ernst; Auret, Francois Danie (IOP Publishing, 2020-02-04)Please read abstract in the article.
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Ngoepe, Phuti Ngako Mahloka; Meyer, Walter Ernst; Auret, Francois Danie; Omotoso, Ezekiel; Diale, M. (Mmantsae Moche) (Elsevier, 2017-06)The deep level transient spectroscopy (DLTS) technique was used to investigate the effects of electron beam exposure (EBE) on n-GaN. A defect with activation energy of 0.12 eV and capture cross section of 8.0 × 10-16 cm2 ...
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Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Paradzah, Alexander Tapera; Diale, M. (Mmantsae Moche); Coelho, Sergio M.M.; Janse van Rensburg, Pieter Johan; Ngoepe, Phuti Ngako Mahloka (Elsevier, 2015-12)Current–voltage, capacitance–voltage and conventional deep level transient spectroscopy at temperature ranges from 40 to 300 K have been employed to study the influence of alpha-particle irradiation from an 241Am source ...
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Omotoso, Ezekiel; Meyer, Walter Ernst; Janse van Rensburg, Pieter Johan; Igumbor, Emmanuel; Tunhuma, Shandirai Malven; Ngoepe, Phuti Ngako Mahloka; Danga, Helga Tariro; Auret, Francois Danie (Elsevier, 2017-10)Please read abstract in the article.
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Paradzah, Alexander Tapera; Auret, Francois Danie; Legodi, Matshisa Johannes; Omotoso, Ezekiel; Diale, M. (Mmantsae Moche) (Elsevier, 2015-09)Nickel Schottky diodes were fabricated on 4H-SiC. The diodes had excellent current rectification with about ten orders of magnitude between 50 V and +2 V. The ideality factor was obtained as 1.05 which signifies the ...
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Ali, Abdulraoof I.; Omotoso, Ezekiel; Nel, Jacqueline Margot; Meyer, Walter Ernst (IOP Publishing, 2023-04)Please read abstract in the article.
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Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Paradzah, Alexander Tapera; Legodi, Matshisa Johannes (Elsevier, 2016-03)Deep-level transient spectroscopy (DLTS) and Laplace-DLTS were used to investigate the effect of alpha-particle irradiation on the electrical properties of nitrogen-doped 4H-SiC. The samples were bombarded with alpha-particles ...
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Tunhuma, Shandirai Malven; Auret, Francois Danie; Nel, Jacqueline Margot; Omotoso, Ezekiel; Danga, Helga Tariro; Igumbor, Emmanuel; Diale, M. (Mmantsae Moche) (Elsevier, 2017-10)We have used deep level transient spectroscopy (DLTS) and Laplace DLTS (L-DLTS) to characterize the electrically active point defects introduced in n-type gallium arsenide by electron beam exposure prior to Schottky ...
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Omotoso, Ezekiel; Meyer, Walter Ernst; Coelho, Sergio M.M.; Diale, M. (Mmantsae Moche); Ngoepe, Phuti Ngako Mahloka; Auret, Francois Danie (Elsevier, 2016-08)We have studied the defects introduced in n-type 4H-SiC during electron beam deposition (EBD) of tungsten by deep-level transient spectroscopy (DLTS). The results from currentvoltage and capacitance-voltage measurements ...
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Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Coelho, Sergio M.M.; Ngoepe, Phuti Ngako Mahloka (Trans Tech Publications, 2016)Deep level transient spectroscopy (DLTS) was used to characterize the defects introduced in n-type, N-doped, 4H-SiC while being exposed to electron beam evaporation conditions. This was done by heating a tungsten source ...
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Omotoso, Ezekiel; Paradzah, Alexander Tapera; Legodi, Matshisa Johannes; Diale, M. (Mmantsae Moche); Meyer, Walter Ernst; Auret, Francois Danie (Elsevier, 2017-10)Please read abstract in the article.
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Paradzah, Alexander Tapera; Omotoso, Ezekiel; Legodi, Matshisa Johannes; Auret, Francois Danie; Meyer, Walter Ernst; Diale, M. (Mmantsae Moche) (Springer, 2016-08)The effect of high energy electron (HEE) irradiation on Ni/4H-SiC Schottky barrier diodes was evaluated by current-voltage (I-V) and capacitance-voltage (C-V) measurements at room temperature. Electron irradiation was ...
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Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC Igumbor, Emmanuel; Olaniyan, Okikiola; Mapasha, Refilwe Edwin; Danga, Helga Tariro; Omotoso, Ezekiel; Meyer, Walter Ernst (IOP Publishing, 2018-04)Please read abstract in the article.
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Igumbor, Emmanuel; Olaniyan, Okikiola; Mapasha, Refilwe Edwin; Danga, Helga Tariro; Omotoso, Ezekiel; Meyer, Walter Ernst (Elsevier, 2019-01)Please read abstract in the article.
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Omotoso, Ezekiel; Meyer, Walter Ernst; Auret, Francois Danie; Paradzah, Alexander Tapera; Diale, M. (Mmantsae Moche); Coelho, Sergio M.M.; Janse van Rensburg, Pieter Johan (Elsevier, 2015-11)Please read abstract in the article.
Now showing items 1-20 of 23