Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC

Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC

Omotoso, Ezekiel; Paradzah, Alexander Tapera; Legodi, Matshisa Johannes; Diale, M. (Mmantsae Moche); Meyer, Walter Ernst; Auret, Francois Danie
URI: http://hdl.handle.net/2263/63094
Date: 2017-10

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