Munthali, Kinnock V.; Theron, C.C. (Chris); Auret, Francois Danie; Coelho, Sergio M.M.
(Indian Academy of Sciences, 2015-06)
Rutherford backscattering spectrometry(RBS) analysis , carried out at various annealing temperatures, of a thin
film of ruthenium on n-type 4-hexagonal silicon carbide (4H-SiC) showed evidence of ruthenium oxidation,
ruthenium ...