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Showing 10 out of a total of 25 results for community: UP Experts (Danie Auret Collection).
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Defect production in strained p-type Si1-xGex by Er implantation
Mamor, M.
;
Pipeleers, B.
;
Auret, Francois Danie
;
Vantomme, M.
(
American Institute of Physics
,
2011-01
)
Electrical characterization of defects in heavy-ion implanted n-type Ge
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Coelho, Sergio M.M.
;
Meyer, Walter Ernst
;
Decoster, S.
;
Matias, V.S.
;
Vantomme, A.
;
Smeets, D.
(
Elsevier
,
2007-04
)
Effect of alpha-particle irradiation on the electrical properties of n-type Ge
Roro, K.T.
;
Janse van Rensburg, Pieter Johan
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
(
Elsevier
,
2009
)
Effects of chemical treatment on barrier height and ideality factors of Au/GaN Schottky diodes
Diale, M. (Mmantsae Moche)
;
Auret, Francois Danie
(
Elsevier
,
2009
)
High-resolution DLTS of vacancy–donor pairs in P-, As- and Sb-doped silicon
Auret, Francois Danie
;
Peaker, A.R.
;
Markevich, V.P.
;
Dobaczewski, L.
;
Gwilliam, R.M.
(
Elsevier
,
2006-04
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range
Mtangi, Wilbert
;
Janse van Rensburg, Pieter Johan
;
Diale, M. (Mmantsae Moche)
;
Auret, Francois Danie
;
Nyamhere, Cloud
;
Nel, Jacqueline Margot
;
Chawanda, Albert
(
Elsevier
,
2010-07
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction
Kassier, Gunther Horst
;
Haupt, K.
;
Erasmus, N.
;
Rohwer, E.G.
;
Von Bergmann, H.M.
;
Schwoerer, H.
;
Coelho, Sergio M.M.
;
Auret, Francois Danie
(
American Institute of Physics (AIP)
,
2010-10
)
Microstructural and surface characterization of thin gold films on n-Ge (111)
Nel, Jacqueline Margot
;
Chawanda, Albert
;
Auret, Francois Danie
;
Jordaan, W.
;
Odendaal, R.Q. (Quintin)
;
Hayes, M.
;
Coelho, Sergio M.M.
(
Elsevier
,
2009
)
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Auret, Francois Danie (24)
Janse van Rensburg, Pieter Johan (9)
Nel, Jacqueline Margot (9)
Meyer, Walter Ernst (8)
Nyamhere, Cloud (8)
Chawanda, Albert (7)
Coelho, Sergio M.M. (7)
Hayes, M. (6)
Mtangi, Wilbert (6)
Diale, M. (Mmantsae Moche) (4)
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Deep level transient spectroscopy (14)
Defects (8)
Diodes, Schottky-barrier (8)
Barrier height (5)
DLTS (5)
Germanium (5)
Annealing (3)
Electron beams (3)
Implantation (3)
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