Electrical characterization of defects in heavy-ion implanted n-type Ge

Electrical characterization of defects in heavy-ion implanted n-type Ge

Auret, Francois Danie; Janse van Rensburg, Pieter Johan; Hayes, M.; Nel, Jacqueline Margot; Coelho, Sergio M.M.; Meyer, Walter Ernst; Decoster, S.; Matias, V.S.; Vantomme, A.; Smeets, D.
URI: http://hdl.handle.net/2263/3017
Date: 2007-04

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