Search
Login
UPSpace Home
→
Natural and Agricultural Sciences
→
Physics
→
Search
JavaScript is disabled for your browser. Some features of this site may not work without it.
Search
Filters
Use filters to refine the search results.
Current Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
New Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Showing 13 out of a total of 13 results for community: Physics.
(0.01 seconds)
Now showing items 1-13 of 13
1
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Ar plasma induced deep levels in epitaxial n-GaAs
Venter, Andre
;
Nyamhere, Cloud
;
Botha, J.R.
;
Auret, Francois Danie
;
Janse van Rensburg, J.P.
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Kolkovsky, V.I.
(
American Institute of Physics
,
2012-03-08
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
Comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques
Mtangi, Wilbert
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Coelho, Sergio M.M.
;
Legodi, Matshisa Johannes
;
Meyer, Walter Ernst
;
Chawanda, Albert
(
American Institute of Physics
,
2011-11
)
Inductively coupled plasma induced deep levels in epitaxial n-GaAs
Venter, Andre
;
Nyamhere, Cloud
;
Botha, J.R.
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Kolkovsky, V.I.
(
Elsevier
,
2012-05
)
Electrical characterization of defects in heavy-ion implanted n-type Ge
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Coelho, Sergio M.M.
;
Meyer, Walter Ernst
;
Decoster, S.
;
Matias, V.S.
;
Vantomme, A.
;
Smeets, D.
(
Elsevier
,
2007-04
)
Field dependence of the E1' and M3' electron traps in inductively coupled Ar plasma treated n-Gallium Arsenide
Venter, Andre
;
Nyamhere, Cloud
;
Botha, J.R.
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Meyer, Walter Ernst
(
American Institute of Physics
,
2012-05-01
)
Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2015-12
)
Current–temperature measurements of a SBD evaporated onto inductively coupled plasma cleaned germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Comparison of two models for phonon assisted tunneling field enhanced emission from defects in Ge measured by DLTS
Pienaar, J.
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
(
Elsevier
,
2012-05
)
The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
(
Elsevier
,
2015-11
)
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
;
Auret, Francois Danie
(
Elsevier
,
2016-08
)
Now showing items 1-13 of 13
1
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Browse
All of UPSpace
Communities & Collections
Issue Date
Authors
Titles
Subjects
Supervisor
UP Author
UP Postgraduate
Type
This Community
Issue Date
Authors
Titles
Subjects
Supervisor
UP Author
UP Postgraduate
Type
My Account
Login
Register
UPSpace Workspace
Discover
Author
Auret, Francois Danie (13)
Coelho, Sergio M.M. (13)
Meyer, Walter Ernst (13)
Janse van Rensburg, Pieter Johan (8)
Nyamhere, Cloud (4)
Omotoso, Ezekiel (4)
Botha, J.R. (3)
Diale, M. (Mmantsae Moche) (3)
Ngoepe, Phuti Ngako Mahloka (3)
Venter, Andre (3)
... View More
Subject
Deep level transient spectroscopy (6)
Defects (6)
Plasma etching (3)
Annealing (2)
Ar plasma etching (2)
Deep-level transient spectroscopy (DLTS) (2)
DLTS (2)
Electron beams (2)
GaAs (2)
Germanium (2)
... View More
Date Issued
2012 (4)
2009 (3)
2015 (2)
2016 (2)
2007 (1)
2011 (1)
Has File(s)
true (13)