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Showing 10 out of a total of 15 results for community: Physics.
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Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
Electrical characterization of defects induced by electron beam exposure in low doped n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
;
Omotoso, Ezekiel
;
Danga, Helga Tariro
;
Igumbor, Emmanuel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-10
)
Electrical characterisation of electron beam exposure induced defects in silicon
Danga, Helga Tariro
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2016-01
)
DLTS characterization of defects in GaN induced by electron beam exposure
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-06
)
Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, Shandirai Malven
;
Diale, M. (Mmantsae Moche)
;
Legodi, Matshisa Johannes
;
Nel, Jacqueline Margot
;
Thabethe, Thabsile Theodora
;
Auret, Francois Danie
(
American Institute of Physics Inc.
,
2018-01-18
)
Characterisation of Cs ion implanted GaN by DLTS
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Hlatshwayo, Thulani Thokozani
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-04
)
Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Nel, Jacqueline Margot
(
American Institute of Physics
,
2013
)
Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
Unexpected properties of the inductively coupled plasma induced defect in germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Nel, J.M.
(
Elsevier
,
2014-04
)
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Auret, Francois Danie (14)
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Deep level transient spectroscopy (DLTS) (15)
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Germanium (2)
Laplace deep level transient spectroscopy (L-DLTS) (2)
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