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Showing 6 out of a total of 6 results for community: Physics.
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Polyaniline nanoparticles for the selective recognition of aldrin : synthesis, characterization, and adsorption
Munyati, M.O.
;
Mbozi, A.
;
Siamwiza, M.N.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-11
)
Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
Electrical characterization of defects induced by electron beam exposure in low doped n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
;
Omotoso, Ezekiel
;
Danga, Helga Tariro
;
Igumbor, Emmanuel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-10
)
Structural, morphological, optical and electrical properties of Schottky diodes based on CBD deposited ZnO : Cu nanorods
Mwankemwa, Benard S.
;
Legodi, Matshisa Johannes
;
Mlambo, Mbuso
;
Nel, Jacqueline Margot
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-07
)
DLTS characterization of defects in GaN induced by electron beam exposure
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-06
)
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Author
Diale, M. (Mmantsae Moche) (6)
Auret, Francois Danie (3)
Omotoso, Ezekiel (3)
Legodi, Matshisa Johannes (2)
Meyer, Walter Ernst (2)
Nel, Jacqueline Margot (2)
Cahen, David (1)
Danga, Helga Tariro (1)
Igumbor, Emmanuel (1)
Legodi, M.J. (Matshisa Johannes) (1)
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Subject
Deep level transient spectroscopy (DLTS) (4)
Defects (2)
Scanning electron microscopy (SEM) (2)
4H-SiC (1)
4H–silicon carbide (1)
Adsorption characteristic (1)
Aldrin (1)
Alpha-particle irradiation (1)
Atomic force microscopy (AFM) (1)
Band edge (1)
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Date Issued
2017 (6)
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true (6)