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Showing 10 out of a total of 85 results for community: Physics.
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Solid state reaction and operational stability of ruthenium Schottky contact-on-6H-SiC under argon annealing
Munthali, Kinnock V.
;
Theron, C.C. (Chris)
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Njoroge, Eric Gitau
(
Springer
,
2015-10
)
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
;
Auret, Francois Danie
(
Elsevier
,
2016-08
)
The fine structure of electron irradiation induced EL2-like defects in n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2016
)
Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Janse van Rensburg, Pieter Johan
;
Nel, Jacqueline Margot
(
American Institute of Physics
,
2013
)
The effect of alpha particle irradiation on electrical properties and defects of ZnO thin films prepared by sol-gel spin coating
Ahmed, M.E.I. (Mubashir)
;
Taghizadeh, Fatemeh
;
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Nel, Jacqueline Margot
(
Elsevier
,
2019-10
)
High-resolution DLTS of vacancy–donor pairs in P-, As- and Sb-doped silicon
Auret, Francois Danie
;
Peaker, A.R.
;
Markevich, V.P.
;
Dobaczewski, L.
;
Gwilliam, R.M.
(
Elsevier
,
2006-04
)
Electrical characterization of metastable defects introduced in GaN by eu-ion implantation
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Diale, M. (Mmantsae Moche)
;
Janse van Rensburg, Pieter Johan
;
Song, S.F.
;
Temst, K.
;
Vantomme, A.
(
Trans Tech
,
2011-03
)
dc-Hydrogen plasma induced defects in bulk n-Ge
Nyamhere, Cloud
;
Venter, Andre
;
Murape, D.M.
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Botha, J.R.
(
Elsevier
,
2012-08
)
The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
(
Elsevier
,
2015-11
)
Microstructure evolution and diffusion of ruthenium in silicon carbide, and the implications for structural integrity of SiC layer in TRISO coated fuel particles
Munthali, Kinnock V.
;
Theron, C.C. (Chris)
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Prinsloo, Linda Charlotta
;
Njoroge, Eric Gitau
(
Elsevier
,
2014-05
)
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Auret, Francois Danie (85)
Meyer, Walter Ernst (38)
Diale, M. (Mmantsae Moche) (36)
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Deep level transient spectroscopy (19)
Defects (18)
Deep level transient spectroscopy (DLTS) (15)
Annealing (12)
Barrier height (10)
Deep-level transient spectroscopy (DLTS) (10)
Germanium (9)
Schottky contacts (9)
4H-SiC (8)
Diodes, Schottky-barrier (8)
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2010 - 2020 (68)
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