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Showing 10 out of a total of 24 results for collection: Research Articles (Danie Auret Collection).
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Current–temperature measurements of a SBD evaporated onto inductively coupled plasma cleaned germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Lithium and electrical properties of ZnO
Vines, L.
;
Monakhov, E.V.
;
Schifano, R.
;
Mtangi, Wilbert
;
Auret, Francois Danie
;
Svensson, B.G.
(
American Institute of Physics
,
2010-03
)
Correlation between barrier heights and ideality factors of Ni/n-Ge (100) schottky barrier diodes
Chawanda, Albert
;
Nel, Jacqueline Margot
;
Auret, Francois Danie
;
Mtangi, Wilbert
;
Nyamhere, Cloud
;
Diale, M. (Mmantsae Moche)
;
Leach, Lindsay Josephine
(
Korean Physical Society
,
2010-12
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Determination of the laterally homogeneous barrier height of palladium Schottky barrier diodes on n-Ge (1 1 1)
Chawanda, Albert
;
Roro, K.T.
;
Auret, Francois Danie
;
Mtangi, Wilbert
;
Nyamhere, Cloud
;
Nel, Jacqueline Margot
;
Leach, Lindsay Josephine
(
Elsevier
,
2011
)
Electrical characterization of rare-earth implanted GaN
Janse van Rensburg, Pieter Johan
;
Auret, Francois Danie
;
Matias, V.S.
;
Vantomme, A.
(
Elsevier
,
2009
)
Radiation damage in ZnO ion implanted at 15 K
Wendler, E.
;
Bilani, O.
;
Gartner, K.
;
Wesch, W.
;
Hayes, M.
;
Auret, Francois Danie
;
Lorenz, K.
;
Alves, E.
(
Elsevier
,
2009
)
Electrical characterization of vapor-phase-grown single-crystal ZnO
Auret, Francois Danie
;
Goodman, Stewart Alexander
;
Legodi, Matshisa Johannes
;
Meyer, Walter Ernst
;
Look, D.C.
(
American Institute of Physics
,
2002-02-25
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Kalibrering van 'n opto-elektroniese stelsel vir die karakterisering van ultraviolet-sensitiewe fotodiodes
Van Schalkwyk, Louwrens
;
Meyer, Walter Ernst
;
Nel, Jacqueline Margot
;
Auret, Francois Danie
(
Suid Afrikaanse Akademie vir Wetenskap & Kuns
,
2011
)
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Auret, Francois Danie (24)
Janse van Rensburg, Pieter Johan (9)
Nel, Jacqueline Margot (9)
Meyer, Walter Ernst (8)
Nyamhere, Cloud (8)
Chawanda, Albert (7)
Coelho, Sergio M.M. (7)
Hayes, M. (6)
Mtangi, Wilbert (6)
Diale, M. (Mmantsae Moche) (4)
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Subject
Deep level transient spectroscopy (14)
Defects (8)
Diodes, Schottky-barrier (8)
Barrier height (5)
DLTS (5)
Germanium (5)
Annealing (3)
Electron beams (3)
Implantation (3)
Ion implantation (3)
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2009 (11)
2010 (4)
2007 (3)
2011 (3)
2006 (2)
2002 (1)
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