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Showing 31 out of a total of 31 results for community: Physics.
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Rare earth interstitial-complexes in Ge : hybrid density functional studies
Igumbor, Emmanuel
;
Omotoso, Ezekiel
;
Danga, Helga Tariro
;
Tunhuma, Shandirai Malven
;
Meyer, Walter Ernst
(
Elsevier
,
2017-10
)
Rare earth substitutional impurities in germanium : a hybrid density functional theory study
Igumbor, Emmanuel
;
Omotoso, Ezekiel
;
Tunhuma, Shandirai Malven
;
Danga, Helga Tariro
;
Meyer, Walter Ernst
(
Elsevier
,
2017-10
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Long range annealing of defects in germanium by low energy plasma ions
Archilla, J.F.R.
;
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Dubinko, V.I.
;
Hizhnyakov, V.
(
Elsevier
,
2015-03
)
A first principle hybrid functional calculation of TmGe 3+-VGe defect complexes in germanium
Igumbor, Emmanuel
;
Mapasha, Refilwe Edwin
;
Andrew, Richard Charles
;
Meyer, Walter Ernst
(
Elsevier
,
2016-09
)
Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Ab-initio study of germanium di-interstitial using a hybrid functional (HSE)
Igumbor, Emmanuel
;
Ouma, C.N.M.
;
Webb, Geoffrey
;
Meyer, Walter Ernst
(
Elsevier
,
2016-01
)
Electrical characterization of 5.4 MeV alpha-particle irradiated 4H-SiC with low doping density
Paradzah, Alexander Tapera
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2015-09
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
Electrical characterization of rare-earth implanted GaN
Janse van Rensburg, Pieter Johan
;
Auret, Francois Danie
;
Matias, V.S.
;
Vantomme, A.
(
Elsevier
,
2009
)
Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS
Unknown author
(
University of Pretoria
,
2010-05-26
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
Laplace current deep level transient spectroscopy measurements of defect states in methylammonium lead bromide single crystals
Rosenberg, John W.
;
Legodi, M.J. (Matshisa Johannes)
;
Rakita, Yevgeny
;
Cahen, David
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2017
)
Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Von Wenckstern, Holger
;
Schmidt, H.
;
Biehne, G.
;
Hochmuth, H.
;
Lorenz, M.
;
Grundmann, Marius
(
Elsevier
,
2007-12
)
Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS
Nyamhere, Cloud
;
Deenapanray, P.N.K.
;
Auret, Francois Danie
;
Farlow, F.C.
(
Elsevier
,
2006
)
Introduction and annealing of primary defects in proton-bombarded n-GaN
Schmidt, Matthias
;
De Meyer, Hannes
;
Jansen van Rensburg, P.J.
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Wiley
,
2014-01
)
Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Nyamhere, Cloud
;
Chawanda, Albert
;
Das, A.G.M.
;
Auret, Francois Danie
;
Hayes, M.
(
Elsevier
,
2007-12-15
)
Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC
Igumbor, Emmanuel
;
Olaniyan, Okikiola
;
Mapasha, Refilwe Edwin
;
Danga, Helga Tariro
;
Omotoso, Ezekiel
;
Meyer, Walter Ernst
(
IOP Publishing
,
2018-04
)
Electrical characterization of process, annealing and irradiation induced defects in ZnO
Unknown author
(
University of Pretoria
,
2013-04-24
)
Electrical and structural characterization of metal germanides
Unknown author
(
University of Pretoria
,
2010
)
A hybrid functional calculation of Tm3+ defects in germanium (Ge)
Igumbor, Emmanuel
;
Meyer, Walter Ernst
(
Elsevier
,
2016-03
)
Ab initio study of metastability of Eu3+ defect complexes in GaN
Ouma, C.N.M.
;
Meyer, Walter Ernst
(
Elsevier
,
2014-04
)
dc-Hydrogen plasma induced defects in bulk n-Ge
Nyamhere, Cloud
;
Venter, Andre
;
Murape, D.M.
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Botha, J.R.
(
Elsevier
,
2012-08
)
Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2015-12
)
Current–temperature measurements of a SBD evaporated onto inductively coupled plasma cleaned germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
The carbon-substitutional-carbon-interstitial (CsCi) defect pair in silicon from hybrid functional calculations
Ouma, C.N.M.
;
Meyer, Walter Ernst
(
Elsevier
,
2016-06
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
SEM analysis of ion implanted SiC
Malherbe, Johan B.
;
Van der Berg, Nic (Nicolaas George)
;
Botha, A.J.
;
Friedland, Erich Karl Helmuth
;
Hlatshwayo, Thulani Thokozani
;
Kuhudzai, Remeredzai Joseph
;
Wendler, E.
;
Wesch, W.
;
Chakraborty, P.
;
Da Silveira, E.F.
(
Elsevier
,
2013-11
)
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
;
Auret, Francois Danie
(
Elsevier
,
2016-08
)
The fine structure of electron irradiation induced EL2-like defects in n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2016
)
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Auret, Francois Danie (18)
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