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Showing 5 out of a total of 25 results for community: UP Experts (Danie Auret Collection).
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Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Analysis of current voltage measurements on Au/Ni/n-GaN Schottky contacts in a wide temperature range
Mtangi, Wilbert
;
Janse van Rensburg, Pieter Johan
;
Diale, M. (Mmantsae Moche)
;
Auret, Francois Danie
;
Nyamhere, Cloud
;
Nel, Jacqueline Margot
;
Chawanda, Albert
(
Elsevier
,
2010-07
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction
Kassier, Gunther Horst
;
Haupt, K.
;
Erasmus, N.
;
Rohwer, E.G.
;
Von Bergmann, H.M.
;
Schwoerer, H.
;
Coelho, Sergio M.M.
;
Auret, Francois Danie
(
American Institute of Physics (AIP)
,
2010-10
)
Microstructural and surface characterization of thin gold films on n-Ge (111)
Nel, Jacqueline Margot
;
Chawanda, Albert
;
Auret, Francois Danie
;
Jordaan, W.
;
Odendaal, R.Q. (Quintin)
;
Hayes, M.
;
Coelho, Sergio M.M.
(
Elsevier
,
2009
)
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Auret, Francois Danie (24)
Janse van Rensburg, Pieter Johan (9)
Nel, Jacqueline Margot (9)
Meyer, Walter Ernst (8)
Nyamhere, Cloud (8)
Chawanda, Albert (7)
Coelho, Sergio M.M. (7)
Hayes, M. (6)
Mtangi, Wilbert (6)
Diale, M. (Mmantsae Moche) (4)
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Deep level transient spectroscopy (14)
Defects (8)
Diodes, Schottky-barrier (8)
Barrier height (5)
DLTS (5)
Germanium (5)
Annealing (3)
Electron beams (3)
Implantation (3)
Ion implantation (3)
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2009 (11)
2010 (4)
2007 (3)
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