Search
Login
UPSpace Home
→
Natural and Agricultural Sciences
→
Physics
→
Search
JavaScript is disabled for your browser. Some features of this site may not work without it.
Search
Filters
Use filters to refine the search results.
Current Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
New Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Showing 2 out of a total of 2 results for community: Physics.
(0.002 seconds)
Now showing items 1-2 of 2
1
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Electrical characterization of deep levels created by bombarding nitrogen-doped 4HSiC with alpha-particle irradiation
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
(
Elsevier
,
2016-03
)
Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Now showing items 1-2 of 2
1
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Browse
All of UPSpace
Communities & Collections
Issue Date
Authors
Titles
Subjects
Supervisor
UP Author
UP Postgraduate
Type
This Community
Issue Date
Authors
Titles
Subjects
Supervisor
UP Author
UP Postgraduate
Type
My Account
Login
Register
UPSpace Workspace
Discover
Author
Auret, Francois Danie (2)
Legodi, Matshisa Johannes (2)
Meyer, Walter Ernst (2)
Omotoso, Ezekiel (2)
Paradzah, Alexander Tapera (2)
Diale, M. (Mmantsae Moche) (1)
Subject
4H-SiC (2)
Alpha-particle irradiation (2)
4H–silicon carbide (1)
Annealing (1)
Band gap states (1)
Deep level transient spectroscopy (DLTS) (1)
Deep levels (1)
Deep-level transient spectroscopy (DLTS) (1)
Defects (1)
Detectors (1)
... View More
Date Issued
2016 (1)
2017 (1)
Has File(s)
true (2)