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Showing 7 out of a total of 7 results for community: Physics.
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Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Electrical characterization of 5.4 MeV alpha-particle irradiated 4H-SiC with low doping density
Paradzah, Alexander Tapera
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2015-09
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
Electrical characterization of defects induced by electron beam exposure in low doped n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
;
Omotoso, Ezekiel
;
Danga, Helga Tariro
;
Igumbor, Emmanuel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-10
)
Characterisation of Cs ion implanted GaN by DLTS
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Hlatshwayo, Thulani Thokozani
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-04
)
Determination of capture barrier energy of the e-center in palladium Schottky barrier diodes of antimony-doped germanium by varying the pulse width
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Igumbor, E.
;
Taleatu, B.A.
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
IOP Publishing
,
2020-02-04
)
DLTS characterization of defects in GaN induced by electron beam exposure
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-06
)
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Author
Auret, Francois Danie (7)
Omotoso, Ezekiel (7)
Diale, M. (Mmantsae Moche) (5)
Meyer, Walter Ernst (5)
Ngoepe, Phuti Ngako Mahloka (3)
Paradzah, Alexander Tapera (3)
Legodi, Matshisa Johannes (2)
Coelho, Sergio M.M. (1)
Danga, Helga Tariro (1)
Hlatshwayo, Thulani Thokozani (1)
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Deep level transient spectroscopy (DLTS) (7)
Defects (3)
Alpha particle irradiation (2)
Defect (2)
Electron beam exposure (2)
4H-SiC (1)
4H–silicon carbide (1)
Alpha-particle irradiation (1)
Band gap states (1)
Capture barrier energy (1)
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2015 (1)
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2018 (1)
2020 (1)
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