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Showing 10 out of a total of 46 results for community: Physics.
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Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2015-12
)
Correlation between barrier heights and ideality factors of Ni/n-Ge (100) schottky barrier diodes
Chawanda, Albert
;
Nel, Jacqueline Margot
;
Auret, Francois Danie
;
Mtangi, Wilbert
;
Nyamhere, Cloud
;
Diale, M. (Mmantsae Moche)
;
Leach, Lindsay Josephine
(
Korean Physical Society
,
2010-12
)
Thermal annealing behaviour of Pd Schottky contacts on melt-grown single crystal ZnO studied by IV and CV measurements
Mtangi, Wilbert
;
Auret, Francois Danie
;
Chawanda, Albert
;
Jansen van Rensburg, P. J.
;
Coelho, Sergio M.M.
;
Nel, J.M.
;
Diale, M. (Mmantsae Moche)
;
Van Schalkwyk, Louwrens
;
Nyamhere, Cloud
(
Elsevier
,
2012-10
)
Effects of high temperature annealing on single crystal ZnO and ZnO devices
Mtangi, Wilbert
;
Auret, Francois Danie
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Chwanda, Albert
;
De Meyer, Hannes
;
Janse van Rensburg, Pieter Johan
;
Nel, Jacqueline Margot
(
American Institute of Physics
,
2012-04-16
)
Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Electrical characterisation of electron beam exposure induced defects in silicon
Danga, Helga Tariro
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2016-01
)
Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, Shandirai Malven
;
Diale, M. (Mmantsae Moche)
;
Legodi, Matshisa Johannes
;
Nel, Jacqueline Margot
;
Thabethe, Thabsile Theodora
;
Auret, Francois Danie
(
American Institute of Physics Inc.
,
2018-01-18
)
Response of Ni/4H-SiC Schottky barrier diodes to alpha-particle irradiation at different fluences
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2016-01
)
DLTS characterization of defects in GaN induced by electron beam exposure
Ngoepe, Phuti Ngako Mahloka
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2017-06
)
In situ study of low-temperature irradiation-induced defects in silicon carbide
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Danga, Helga Tariro
;
Nel, Jacqueline Margot
;
Diale, M. (Mmantsae Moche)
(
Springer
,
2019-06
)
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Diale, M. (Mmantsae Moche) (46)
Auret, Francois Danie (34)
Nel, Jacqueline Margot (16)
Meyer, Walter Ernst (15)
Omotoso, Ezekiel (11)
Mtangi, Wilbert (10)
Legodi, Matshisa Johannes (9)
Ngoepe, Phuti Ngako Mahloka (9)
Chawanda, Albert (8)
Coelho, Sergio M.M. (7)
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Deep level transient spectroscopy (DLTS) (11)
Annealing (8)
Defects (7)
Deep-level transient spectroscopy (DLTS) (6)
Schottky contacts (5)
4H-SiC (4)
AlGaN (4)
Barrier height (4)
Hematite (4)
Gaussian distribution (3)
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