Structural and mechanical properties of tantalum thin films ected by nitrogen ion implantation

Structural and mechanical properties of tantalum thin films ected by nitrogen ion implantation

Ramezani, A.H.; Hoseinzadeh, Siamak; Ebrahiminejad, Zh.
URI: http://hdl.handle.net/2263/77180
Date: 2020-03

Abstract:

Please read abstract in the article.

Show full item record

Files in this item

Icon
Name: Ramezani_Structur ...
Size: 1.418Mb
Format: PDF
Description: Postprint Article
View/Open

This item appears in the following Collection(s)