Ab initio study of the effect of hydrogen passivation on boron-oxygen-carbon related defect complexes in silicon

Ab initio study of the effect of hydrogen passivation on boron-oxygen-carbon related defect complexes in silicon

Abdurrazaq, Abdulgaffar; Raji, Abdulrafiu T.; Meyer, Walter Ernst
URI: http://hdl.handle.net/2263/73832
Date: 2020-05

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