Investigating the structural changes induced by SHI on W–SiC samples
| dc.contributor.author | Thabethe, Thabsile Theodora | |
| dc.contributor.author | Ntsoane, Tshepo Paul | |
| dc.contributor.author | Biira, Saphina | |
| dc.contributor.author | Njoroge, Eric Gitau | |
| dc.contributor.author | Hlatshwayo, Thulani Thokozani | |
| dc.contributor.author | Skuratov, Vladimir Alexeevich | |
| dc.contributor.author | Malherbe, Johan B. | |
| dc.contributor.email | thabsile.thabethe@up.ac.za | en_ZA |
| dc.date.accessioned | 2020-04-07T11:51:42Z | |
| dc.date.issued | 2020-04 | |
| dc.description.abstract | Please read abstract in the article. | en_ZA |
| dc.description.department | Physics | en_ZA |
| dc.description.embargo | 2021-04-01 | |
| dc.description.librarian | hj2020 | en_ZA |
| dc.description.sponsorship | The National Research Foundation (NRF) of South Africa | en_ZA |
| dc.description.uri | http://www.journals.elsevier.com/vacuum | en_ZA |
| dc.identifier.citation | Thabethe, T.T., Ntsoane, T.P., Biira, S. et al. 2020, 'Investigating the structural changes induced by SHI on W–SiC samples', Vacuum, vol. 174, art. 109230, pp. 1-5. | en_ZA |
| dc.identifier.issn | 0042-207X (print) | |
| dc.identifier.issn | 1879-2715 (online) | |
| dc.identifier.other | 10.1016/j.vacuum.2020.109230 | |
| dc.identifier.uri | http://hdl.handle.net/2263/74075 | |
| dc.language.iso | en | en_ZA |
| dc.publisher | Elsevier | en_ZA |
| dc.rights | © 2020 Elsevier Ltd. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Vacuum. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Vacuum, vol. 174, art. 109230, pp. 1-5, 2020. doi : 10.1016/j.vacuum.2020.109230. | en_ZA |
| dc.subject | Swift heavy ion (SHI) | en_ZA |
| dc.subject | Rutherford backscattering spectrometry (RBS) | en_ZA |
| dc.subject | Scanning electron microscopy (SEM) | en_ZA |
| dc.subject | X-ray diffraction (XRD) | en_ZA |
| dc.subject | Tungsten | en_ZA |
| dc.subject | Thin film | en_ZA |
| dc.subject | Reaction | en_ZA |
| dc.subject | Irradiation | en_ZA |
| dc.subject | Metal-silicon carbide (m-SiC) | en_ZA |
| dc.title | Investigating the structural changes induced by SHI on W–SiC samples | en_ZA |
| dc.type | Postprint Article | en_ZA |