Investigating the structural changes induced by SHI on W–SiC samples
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Date
Authors
Thabethe, Thabsile Theodora
Ntsoane, Tshepo Paul
Biira, Saphina
Njoroge, Eric Gitau
Hlatshwayo, Thulani Thokozani
Skuratov, Vladimir Alexeevich
Malherbe, Johan B.
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Publisher
Elsevier
Abstract
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Description
Keywords
Swift heavy ion (SHI), Rutherford backscattering spectrometry (RBS), Scanning electron microscopy (SEM), X-ray diffraction (XRD), Tungsten, Thin film, Reaction, Irradiation, Metal-silicon carbide (m-SiC)
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Citation
Thabethe, T.T., Ntsoane, T.P., Biira, S. et al. 2020, 'Investigating the structural changes induced by SHI on W–SiC samples', Vacuum, vol. 174, art. 109230, pp. 1-5.