Structural and mechanical properties of tantalum thin films ected by nitrogen ion implantation

dc.contributor.authorRamezani, A.H.
dc.contributor.authorHoseinzadeh, Siamak
dc.contributor.authorEbrahiminejad, Zh.
dc.date.accessioned2020-11-25T14:47:20Z
dc.date.issued2020-03
dc.description.abstractPlease read abstract in the article.en_ZA
dc.description.departmentMechanical and Aeronautical Engineeringen_ZA
dc.description.embargo2021-03-09
dc.description.librarianhj2020en_ZA
dc.description.librarianmi2025en
dc.description.sdgSDG-03: Good health and well-beingen
dc.description.sdgSDG-04: Quality educationen
dc.description.sdgSDG-09: Industry, innovation and infrastructureen
dc.description.sdgSDG-12: Responsible consumption and productionen
dc.description.sdgSDG-13: Climate actionen
dc.description.urihttp://www.worldscientific.com/worldscinet/mplben_ZA
dc.identifier.citationRamezani, A.H., Hoseinzadeh, S. & Ebrahiminejad, Zh. 2020, 'Structural and mechanical properties of tantalum thin films ected by nitrogen ion implantation', Modern Physics Letters B, vol. 34, no. 15, art. 2050163.en_ZA
dc.identifier.issn0217-9849 (print)
dc.identifier.issn1793-6640 (online)
dc.identifier.other10.1142/S0217984920501638
dc.identifier.urihttp://hdl.handle.net/2263/77180
dc.language.isoenen_ZA
dc.publisherWorld Scientific Publishingen_ZA
dc.rights© 2020 World Scientific Publishing Co. Electronic version of an article published as Modern Physics Letters B, vol. 34, no. 15, art. 2050163, 2020. doi : 10.1142/S0217984920501638. The original publication is available at : http://www.worldscinet.commplb.en_ZA
dc.subjectIon implantationen_ZA
dc.subjectX-ray diffraction (XRD)en_ZA
dc.subjectTantalumen_ZA
dc.subjectAtomic force microscopy (AFM)en_ZA
dc.subjectFriction coefficienten_ZA
dc.subjectMicrohardnessen_ZA
dc.subjectScanning electron microscopy (SEM)en_ZA
dc.subject.otherEngineering, built environment and information technology articles SDG-03
dc.subject.otherSDG-03: Good health and well-being
dc.subject.otherEngineering, built environment and information technology articles SDG-04
dc.subject.otherSDG-04: Quality education
dc.subject.otherEngineering, built environment and information technology articles SDG-09
dc.subject.otherSDG-09: Industry, innovation and infrastructure
dc.subject.otherEngineering, built environment and information technology articles SDG-12
dc.subject.otherSDG-12: Responsible consumption and production
dc.subject.otherEngineering, built environment and information technology articles SDG-13
dc.subject.otherSDG-13: Climate action
dc.titleStructural and mechanical properties of tantalum thin films ected by nitrogen ion implantationen_ZA
dc.typePostprint Articleen_ZA

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