The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes
| dc.contributor.author | Msimanga, M. | |
| dc.contributor.author | Wamwangi, D. | |
| dc.contributor.author | Comrie, C.M. | |
| dc.contributor.author | Pineda-Vargas, C.A. | |
| dc.contributor.author | Nkosi, M. | |
| dc.contributor.author | Hlatshwayo, Thulani Thokozani | |
| dc.date.accessioned | 2014-11-04T07:38:41Z | |
| dc.date.available | 2014-11-04T07:38:41Z | |
| dc.date.issued | 2013-02 | |
| dc.description.abstract | We report here on the recently built Heavy Ion ERDA set up at iThemba LABS Gauteng; describing a typical application in the study of interfacial reactions in an Al2O3–Ti ceramic–metal multilayer structure annealed in vacuum at 800 C for 2 h. Depth profile extraction was found to be best obtained through combined use of direct calculation and Monte Carlo simulation codes as opposed to using just either of the methods. The obtained profile suggests a case of the Kirkendall effect, whereupon the inter-diffusion between the metal and the ceramic was largely due to the faster diffusion of the metal into the amorphous ceramic than diffusion of the ceramic elements into the metallic layer. | en_US |
| dc.description.librarian | hb2014 | en_US |
| dc.description.sponsorship | National Research Foundation (iThemba LABS) and the International Atomic Energy Agency (IAEA). | en_US |
| dc.description.uri | http://www.elsevier.com/locate/nimb | en_US |
| dc.identifier.citation | Msimanga, M,Wamwangi, D, Comrie, CM, Pineda-Vargas, CA, Nkosi, M & Hlatshwayo, T 2013, 'The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes', Nuclear Instruments and Methods in Physics Research, Section B : Beam Interactions with Materials and Atoms, vol. 296, pp. 54-60. | en_US |
| dc.identifier.issn | 0168-583X (print) | |
| dc.identifier.issn | 1872-9584 (online) | |
| dc.identifier.other | 10.1016/j.nimb.2012.11.015 | |
| dc.identifier.uri | http://hdl.handle.net/2263/42480 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.rights | © 2012 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 296, pp. 54-60, 2013. doi : 10.1016/j.nimb.2012.11.015. | en_US |
| dc.subject | Heavy Ion ERDA | en_US |
| dc.subject | Energy resolution | en_US |
| dc.subject | Multiple scattering | en_US |
| dc.subject | Depth profiling | en_US |
| dc.subject | Kirkendall effect | en_US |
| dc.title | The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes | en_US |
| dc.type | Postprint Article | en_US |