The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes
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Date
Authors
Msimanga, M.
Wamwangi, D.
Comrie, C.M.
Pineda-Vargas, C.A.
Nkosi, M.
Hlatshwayo, Thulani Thokozani
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
We report here on the recently built Heavy Ion ERDA set up at iThemba LABS Gauteng; describing a typical
application in the study of interfacial reactions in an Al2O3–Ti ceramic–metal multilayer structure
annealed in vacuum at 800 C for 2 h. Depth profile extraction was found to be best obtained through
combined use of direct calculation and Monte Carlo simulation codes as opposed to using just either
of the methods. The obtained profile suggests a case of the Kirkendall effect, whereupon the inter-diffusion
between the metal and the ceramic was largely due to the faster diffusion of the metal into the amorphous
ceramic than diffusion of the ceramic elements into the metallic layer.
Description
Keywords
Heavy Ion ERDA, Energy resolution, Multiple scattering, Depth profiling, Kirkendall effect
Sustainable Development Goals
Citation
Msimanga, M,Wamwangi, D, Comrie, CM, Pineda-Vargas, CA, Nkosi, M & Hlatshwayo, T 2013, 'The new Heavy Ion ERDA set up at iThemba LABS Gauteng : multilayer thin film depth profiling using direct calculation and Monte Carlo simulation codes', Nuclear Instruments and Methods in Physics Research, Section B : Beam Interactions with Materials and Atoms, vol. 296, pp. 54-60.