Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers

dc.contributor.authorNel, Hendrik P.
dc.contributor.authorDualibe, Fortunato Carlos
dc.contributor.authorStander, Tinus
dc.contributor.emailu12077497@tuks.co.zaen_US
dc.date.accessioned2024-04-15T08:51:33Z
dc.date.available2024-04-15T08:51:33Z
dc.date.issued2023
dc.description.abstractPlease read abstract in the article.en_US
dc.description.departmentElectrical, Electronic and Computer Engineeringen_US
dc.description.librarianhj2024en_US
dc.description.sdgSDG-09: Industry, innovation and infrastructureen_US
dc.description.sponsorshipThe NRF/F.RS.-FNRS South Africa–Wallonia Joint Science and Technology Research Collaboration.en_US
dc.description.urihttps://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8784029en_US
dc.identifier.citationH.P. Nel, F.C. Dualibe and T. Stander, "Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers," in IEEE Open Journal of Circuits and Systems, vol. 4, pp. 70-84, 2023, doi: 10.1109/OJCAS.2022.3232638.en_US
dc.identifier.issn2644-1225 (online)
dc.identifier.other10.1109/OJCAS.2022.3232638
dc.identifier.urihttp://hdl.handle.net/2263/95512
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.en_US
dc.subjectOscillation-based testing (OBT)en_US
dc.subjectOscillation-based built-in self-testing (OBIST)en_US
dc.subjectCircuit faultsen_US
dc.subjectIntegrated circuit modelingen_US
dc.subjectBuilt-in self-testen_US
dc.subjectCircuit simulationen_US
dc.subjectProcess, voltage and temperature (PVT)en_US
dc.subjectCMOS technologyen_US
dc.subjectComplementary metal-oxide semiconductor (CMOS)en_US
dc.subjectDesign for testabilityen_US
dc.subjectMicrowave integrated circuitsen_US
dc.subjectFault detectionen_US
dc.subjectCircuit simulationen_US
dc.subjectDesign for testabilityen_US
dc.subjectLow-noise amplifier (LNA)en_US
dc.subjectSDG-09: Industry, innovation and infrastructureen_US
dc.titleInfluence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiersen_US
dc.typeArticleen_US

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