Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers
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Date
Authors
Nel, Hendrik P.
Dualibe, Fortunato Carlos
Stander, Tinus
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers
Abstract
Please read abstract in the article.
Description
Keywords
Oscillation-based testing (OBT), Oscillation-based built-in self-testing (OBIST), Circuit faults, Integrated circuit modeling, Built-in self-test, Circuit simulation, Process, voltage and temperature (PVT), CMOS technology, Complementary metal-oxide semiconductor (CMOS), Design for testability, Microwave integrated circuits, Fault detection, Circuit simulation, Design for testability, Low-noise amplifier (LNA), SDG-09: Industry, innovation and infrastructure
Sustainable Development Goals
SDG-09: Industry, innovation and infrastructure
Citation
H.P. Nel, F.C. Dualibe and T. Stander, "Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers," in IEEE Open Journal of Circuits and Systems, vol. 4, pp. 70-84, 2023, doi: 10.1109/OJCAS.2022.3232638.