Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon
| dc.contributor.author | Adeojo, Samuel Adedigba | |
| dc.contributor.author | Malherbe, Johan B. | |
| dc.contributor.author | Azarov, Alexander | |
| dc.contributor.author | Odutemowo, Opeyemi Shakirah | |
| dc.contributor.author | Njoroge, Eric Gitau | |
| dc.contributor.author | Abdelbagi, Hesham Abdelbagi Ali | |
| dc.contributor.author | Mpelane, Siyasanga | |
| dc.contributor.author | Hlatshwayo, Thulani Thokozani | |
| dc.date.accessioned | 2023-07-11T13:09:33Z | |
| dc.date.available | 2023-07-11T13:09:33Z | |
| dc.date.issued | 2022-07 | |
| dc.description.abstract | Please read abstract in the article. | en_US |
| dc.description.department | Physics | en_US |
| dc.description.librarian | hj2023 | en_US |
| dc.description.sponsorship | The AST&D scholarship from the Tertiary Education Trust Fund (TETFund), Nigeria, and the Postgraduate Bursary from the University of Pretoria, South Africa. | en_US |
| dc.description.uri | http://www.elsevier.com/locate/ssscie | en_US |
| dc.identifier.citation | Adeojo, S., Malherbe, J., Azarov, A., et al. 2022, 'Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon', Solid State Sciences, vol. 129, art. 106914, pp. 1-10, doi : 10.1016/j.solidstatesciences.2022.106914. | en_US |
| dc.identifier.issn | 1293-2558 (print) | |
| dc.identifier.issn | 1873-3085 (online) | |
| dc.identifier.other | 10.1016/j.solidstatesciences.2022.106914 | |
| dc.identifier.uri | http://hdl.handle.net/2263/91348 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.rights | © 2022 Elsevier Masson SAS. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Solid State Sciences. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Solid State Sciences, vol. 129, art. 106914, pp. 1-10, doi : 10.1016/j.solidstatesciences.2022.106914. | en_US |
| dc.subject | Transmission electron microscopy (TEM) | en_US |
| dc.subject | Secondary ion mass spectrometry (SIMS) | en_US |
| dc.subject | Raman spectroscopy | en_US |
| dc.subject | Implantation defect | en_US |
| dc.subject | Trapping | en_US |
| dc.subject | De-trapping | en_US |
| dc.title | Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon | en_US |
| dc.type | Postprint Article | en_US |