Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon
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Authors
Adeojo, Samuel Adedigba
Malherbe, Johan B.
Azarov, Alexander
Odutemowo, Opeyemi Shakirah
Njoroge, Eric Gitau
Abdelbagi, Hesham Abdelbagi Ali
Mpelane, Siyasanga
Hlatshwayo, Thulani Thokozani
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Elsevier
Abstract
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Keywords
Transmission electron microscopy (TEM), Secondary ion mass spectrometry (SIMS), Raman spectroscopy, Implantation defect, Trapping, De-trapping
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Citation
Adeojo, S., Malherbe, J., Azarov, A., et al. 2022, 'Effects of implantation temperature and annealing on structural evolution and migration of Se into glassy carbon', Solid State Sciences, vol. 129, art. 106914, pp. 1-10, doi : 10.1016/j.solidstatesciences.2022.106914.