The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis

dc.contributor.authorMadito, M.J. (Moshawe)
dc.contributor.authorIsmail, Mahjoub Yagoub Abdalla
dc.contributor.authorHlatshwayo, Thulani Thokozani
dc.contributor.authorMtshali, C.B.
dc.date.accessioned2021-11-23T09:30:00Z
dc.date.available2021-11-23T09:30:00Z
dc.date.issued2020-03
dc.description.abstractPlease read abstract in the article.en_ZA
dc.description.departmentPhysicsen_ZA
dc.description.librarianhj2021en_ZA
dc.description.sponsorshipThe National Research Foundation (NRF) of South Africa via iThemba LABS Materials Research Department (MRD) and University of Pretoria (South Africa).en_ZA
dc.description.urihttp://www.elsevier.com/locate/apsuscen_ZA
dc.identifier.citationMadito, M.J., Ismail, M.Y.A., Hlatshwayo, T.T. et al. 2020, 'The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis', Applied Surface Science, vol. 506, art. 145001, pp. 1-8.en_ZA
dc.identifier.issn0169-4332 (print)
dc.identifier.issn1873-5584 (online)
dc.identifier.other10.1016/j.apsusc.2019.145001
dc.identifier.urihttp://hdl.handle.net/2263/82805
dc.language.isoenen_ZA
dc.publisherElsevieren_ZA
dc.rights© 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Applied Surface Science. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Applied Surface Science, vol. 506, art. 145001, pp. 1-8, 2020. doi : 10.1016/j.apsusc.2019.145001.en_ZA
dc.subjectGlassy carbon electrodes (GCE)en_ZA
dc.subjectSp3 hybridizationen_ZA
dc.subjectBoundary defectsen_ZA
dc.subjectXe ionsen_ZA
dc.subjectIon implantationen_ZA
dc.subjectRaman spectroscopyen_ZA
dc.titleThe nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysisen_ZA
dc.typePostprint Articleen_ZA

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