The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis
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Date
Authors
Madito, M.J. (Moshawe)
Ismail, Mahjoub Yagoub Abdalla
Hlatshwayo, Thulani Thokozani
Mtshali, C.B.
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Publisher
Elsevier
Abstract
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Keywords
Glassy carbon electrodes (GCE), Sp3 hybridization, Boundary defects, Xe ions, Ion implantation, Raman spectroscopy
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Citation
Madito, M.J., Ismail, M.Y.A., Hlatshwayo, T.T. et al. 2020, 'The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis', Applied Surface Science, vol. 506, art. 145001, pp. 1-8.