Surface roughness of InP after N+2 bombardment : Ion areic dose dependence

dc.contributor.advisorMalherbe, Johan B.en
dc.contributor.coadvisorVan den Berg, Noelanien
dc.contributor.emailupetd@up.ac.zaen
dc.contributor.postgraduateOsman, Sarah Omer Siddigen
dc.date.accessioned2013-09-06T18:03:35Z
dc.date.available2005-05-20en
dc.date.available2013-09-06T18:03:35Z
dc.date.created2004-09-01en
dc.date.issued2006-05-20en
dc.date.submitted2005-05-13en
dc.descriptionDissertation (MSc (Physics))--University of Pretoria, 2006.en
dc.description.abstractPlease read the abstract in the section front of this document.en
dc.description.availabilityunrestricteden
dc.description.departmentPhysicsen
dc.identifier.citationOsman, SOS 2004, Surface roughness of InP after N+2 bombardment: Ion areic dose dependence, MSc dissertation, University of Pretoria, Pretoria, viewed yymmdd < http://hdl.handle.net/2263/24608 >en
dc.identifier.otherH250/agen
dc.identifier.upetdurlhttp://upetd.up.ac.za/thesis/available/etd-05132005-105139/en
dc.identifier.urihttp://hdl.handle.net/2263/24608
dc.language.isoen
dc.publisherUniversity of Pretoriaen_ZA
dc.rights© 2004, University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria.en
dc.subjectElectronics materialsen
dc.subjectIndium compoundsen
dc.subjectSemiconducrtorsen
dc.subjectSurface roughnessen
dc.subjectIndium phosphideen
dc.subjectUCTDen_US
dc.titleSurface roughness of InP after N+2 bombardment : Ion areic dose dependenceen
dc.typeDissertationen

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