Surface roughness of InP after N+2 bombardment : Ion areic dose dependence

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dissertation.pdf (3.36 MB)

Date

2006-05-20

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University of Pretoria

Abstract

Please read the abstract in the section front of this document.

Description

Dissertation (MSc (Physics))--University of Pretoria, 2006.

Keywords

Electronics materials, Indium compounds, Semiconducrtors, Surface roughness, Indium phosphide, UCTD

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Citation

Osman, SOS 2004, Surface roughness of InP after N+2 bombardment: Ion areic dose dependence, MSc dissertation, University of Pretoria, Pretoria, viewed yymmdd < http://hdl.handle.net/2263/24608 >

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http://hdl.handle.net/2263/24608

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Theses and Dissertations (University of Pretoria)
Theses and Dissertations (Physics)
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