Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers

Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers

Nel, Hendrik P.; Dualibe, Fortunato Carlos; Stander, Tinus
URI: http://hdl.handle.net/2263/95512
Date: 2023

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