The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis
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| dc.contributor.author | Madito, M.J. (Moshawe)
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| dc.contributor.author | Ismail, Mahjoub Yagoub Abdalla
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| dc.contributor.author | Hlatshwayo, Thulani Thokozani
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| dc.contributor.author | Mtshali, C.B.
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| dc.date.accessioned | 2021-11-23T09:30:00Z | |
| dc.date.available | 2021-11-23T09:30:00Z | |
| dc.date.issued | 2020-03 | |
| dc.description.abstract | Please read abstract in the article. | en_ZA |
| dc.description.department | Physics | en_ZA |
| dc.description.librarian | hj2021 | en_ZA |
| dc.description.sponsorship | The National Research Foundation (NRF) of South Africa via iThemba LABS Materials Research Department (MRD) and University of Pretoria (South Africa). | en_ZA |
| dc.description.uri | http://www.elsevier.com/locate/apsusc | en_ZA |
| dc.identifier.citation | Madito, M.J., Ismail, M.Y.A., Hlatshwayo, T.T. et al. 2020, 'The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis', Applied Surface Science, vol. 506, art. 145001, pp. 1-8. | en_ZA |
| dc.identifier.issn | 0169-4332 (print) | |
| dc.identifier.issn | 1873-5584 (online) | |
| dc.identifier.other | 10.1016/j.apsusc.2019.145001 | |
| dc.identifier.uri | http://hdl.handle.net/2263/82805 | |
| dc.language.iso | en | en_ZA |
| dc.publisher | Elsevier | en_ZA |
| dc.rights | © 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Applied Surface Science. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Applied Surface Science, vol. 506, art. 145001, pp. 1-8, 2020. doi : 10.1016/j.apsusc.2019.145001. | en_ZA |
| dc.subject | Glassy carbon electrodes (GCE) | en_ZA |
| dc.subject | Sp3 hybridization | en_ZA |
| dc.subject | Boundary defects | en_ZA |
| dc.subject | Xe ions | en_ZA |
| dc.subject | Ion implantation | en_ZA |
| dc.subject | Raman spectroscopy | en_ZA |
| dc.title | The nature of surface defects in Xe ion-implanted glassy carbon annealed at high temperatures: Raman spectroscopy analysis | en_ZA |
| dc.type | Postprint Article | en_ZA |
