Structural and electrical properties of Mg-doped vanadium dioxide thin films via room-temperature ion implantation
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Date
Authors
Mabakachaba, B.M.
Madiba, I.G.
Kennedy, J.
Kaviyarasu, K.
Ngoupe, P.
Khanyile, B.S.
Janse van Rensburg, Johan
Ezema, F.
Arendse, C.J.
Maaza, M.
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
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Description
Keywords
Mg-implated, Vanadium dioxide, Ion implantation, Fluence, Transition phase, Electrical properties, Thin flim, SIMNRA, Rutherford backscattering spectroscopy (RBS)
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Citation
Mabakachaba, B.M., Madiba, I.G., Kennedy, J. et al. 2020, 'Structural and electrical properties of Mg-doped vanadium dioxide thin films via room-temperature ion implantation', Surfaces and Interfaces, vol. 20, art. 100590, pp. 1-6.