Structural and electrical properties of Mg-doped vanadium dioxide thin films via room-temperature ion implantation

dc.contributor.authorMabakachaba, B.M.
dc.contributor.authorMadiba, I.G.
dc.contributor.authorKennedy, J.
dc.contributor.authorKaviyarasu, K.
dc.contributor.authorNgoupe, P.
dc.contributor.authorKhanyile, B.S.
dc.contributor.authorJanse van Rensburg, Johan
dc.contributor.authorEzema, F.
dc.contributor.authorArendse, C.J.
dc.contributor.authorMaaza, M.
dc.date.accessioned2021-11-09T14:03:42Z
dc.date.available2021-11-09T14:03:42Z
dc.date.issued2020-09
dc.description.abstractPlease abstract in the article.en_ZA
dc.description.departmentPhysicsen_ZA
dc.description.librarianhj2021en_ZA
dc.description.sponsorshipThe National Research Foundation of South Africaen_ZA
dc.description.urihttps://www.elsevier.com/locate/surfinen_ZA
dc.identifier.citationMabakachaba, B.M., Madiba, I.G., Kennedy, J. et al. 2020, 'Structural and electrical properties of Mg-doped vanadium dioxide thin films via room-temperature ion implantation', Surfaces and Interfaces, vol. 20, art. 100590, pp. 1-6.en_ZA
dc.identifier.issn2468-0230 (online)
dc.identifier.other10.1016/j.surfin.2020.100590
dc.identifier.urihttp://hdl.handle.net/2263/82612
dc.language.isoenen_ZA
dc.publisherElsevieren_ZA
dc.rights© 2020 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Surfaces and Interfaces, vol. 20, art. 100590, pp. 1-6, 2020. doi : 10.1016/j.surfin.2020.100590.en_ZA
dc.subjectMg-implateden_ZA
dc.subjectVanadium dioxideen_ZA
dc.subjectIon implantationen_ZA
dc.subjectFluenceen_ZA
dc.subjectTransition phaseen_ZA
dc.subjectElectrical propertiesen_ZA
dc.subjectThin flimen_ZA
dc.subjectSIMNRAen_ZA
dc.subjectRutherford backscattering spectroscopy (RBS)en_ZA
dc.titleStructural and electrical properties of Mg-doped vanadium dioxide thin films via room-temperature ion implantationen_ZA
dc.typePostprint Articleen_ZA

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