Mokgadi, Thapelo Freddy; Abdalla, Zaki Adam Yousif; Madhuku, M.; Njoroge, Eric Gitau; Mlambo, M.; Mdluli, P.; Sohatsky, A.; Skuratov, V.A.; Malherbe, Johan B.; Hlatshwayo, Thulani Thokozani
(Frontiers Media, 2023-11-10)
The presence of radiation-induced defects and the high temperature of
implantation are breeding grounds for helium (He) to accumulate and form Heinduced
defects (bubbles, blisters, craters, and cavities) in silicon carbide ...