Migration behaviour of selenium implanted into polycrystalline 3C–SiC
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Date
Authors
Abdalla, Zaki Adam Yousif
Ismail, Mahjoub Yagoub Abdalla
Njoroge, Eric Gitau
Hlatshwayo, Thulani Thokozani
Wendler Elke
Malherbe, Johan B.
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
Please read abstract in the article.
Description
Keywords
Diffusion, Polycrystalline, Silicon carbide (SiC), Raman spectroscopy, Rutherford backscattering spectrometry (RBS), Scanning electron microscopy (SEM)
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Citation
Abdalla, Z.A.Y., Ismail, M.Y.A., Njoroge, E.G. et al. 2020, 'Migration behaviour of selenium implanted into polycrystalline 3C–SiC', Vacuum, vol. 175, art. 109235, pp. 1-6.