Defects in swift heavy ion irradiated n-4H-SiC
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Date
Authors
Tunhuma, Shandirai Malven
Diale, M. (Mmantsae Moche)
Nel, Jacqueline Margot
Madito, M.J. (Moshawe)
Hlatshwayo, Thulani Thokozani
Auret, Francois Danie
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Publisher
Elsevier
Abstract
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Keywords
Deep level transient spectroscopy (DLTS), Binary collision approximations, Raman spectroscopy, Atomic force microscopy (AFM), Swift heavy ion (SHI)
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Citation
Tunhuma, S.M., Diale, M., Nel, J.M. et al. 2019, 'Defects in swift heavy ion irradiated n-4H-SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 460, pp. 119-124.