Defects in swift heavy ion irradiated n-4H-SiC
| dc.contributor.author | Tunhuma, Shandirai Malven | |
| dc.contributor.author | Diale, M. (Mmantsae Moche) | |
| dc.contributor.author | Nel, Jacqueline Margot | |
| dc.contributor.author | Madito, M.J. (Moshawe) | |
| dc.contributor.author | Hlatshwayo, Thulani Thokozani | |
| dc.contributor.author | Auret, Francois Danie | |
| dc.contributor.email | u13259394@tuks.co.za | en_ZA |
| dc.date.accessioned | 2020-07-28T08:49:41Z | |
| dc.date.issued | 2019-12 | |
| dc.description.abstract | Please read abstract in the article. | en_ZA |
| dc.description.department | Physics | en_ZA |
| dc.description.embargo | 2020-12-01 | |
| dc.description.librarian | hj2020 | en_ZA |
| dc.description.uri | http://www.elsevier.com/locate/nimb | en_ZA |
| dc.identifier.citation | Tunhuma, S.M., Diale, M., Nel, J.M. et al. 2019, 'Defects in swift heavy ion irradiated n-4H-SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 460, pp. 119-124. | en_ZA |
| dc.identifier.issn | 0168-583X (print) | |
| dc.identifier.issn | 1872-9584 (online) | |
| dc.identifier.other | 10.1016/j.nimb.2018.11.046 | |
| dc.identifier.uri | http://hdl.handle.net/2263/75463 | |
| dc.language.iso | en | en_ZA |
| dc.publisher | Elsevier | en_ZA |
| dc.rights | © 2019 Elsevier B.V. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 460, pp. 119-124, 2019. doi : 10.1016/j.nimb.2018.11.046. | en_ZA |
| dc.subject | Deep level transient spectroscopy (DLTS) | en_ZA |
| dc.subject | Binary collision approximations | en_ZA |
| dc.subject | Raman spectroscopy | en_ZA |
| dc.subject | Atomic force microscopy (AFM) | en_ZA |
| dc.subject | Swift heavy ion (SHI) | en_ZA |
| dc.title | Defects in swift heavy ion irradiated n-4H-SiC | en_ZA |
| dc.type | Postprint Article | en_ZA |