Influence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorods

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dc.contributor.upauthor Mwankemwa, Benard S.
dc.contributor.upauthor Nambala, Fred Joe
dc.contributor.upauthor Kyeyune, Farooq
dc.contributor.upauthor latshwayo, Thulani Thokozani
dc.contributor.upauthor Nel, Jacqueline Margot
dc.contributor.upauthor Diale, M. (Mmantsae Moche)
dc.date.accessioned 2017-09-05T06:17:33Z
dc.date.issued 2017-11
dc.description.abstract Nanostructured zinc oxide synthesized using an easy and low temperature chemical bath deposition method are among the most promising low cost semiconducting nanostructures investigated for a variety of applications. We successfully report the effects of ammonia solution in the growth of ZnO nanorods at a temperature of 60 °C. Successive addition of ammonia altered the degree of supersaturation of the growth solution, causing a significant deviation in the morphology and crystal orientation of ZnO nanorods. Field emission scanning Electron Microscopy images revealed changes in surface morphology of ZnO nanorods with respect to addition of specific amounts of ammonia. X-ray diffraction analysis revealed wurtzite crystal structure of ZnO which was further supported by X-ray photoelectron studies, optical absorbance and Raman spectra that also revealed the existence of wurtzite ZnO. The current-voltage measurement showed the electrical properties of the synthesized ZnO nanorods. The vertically grown nanorods with flat tops, effect more rectifying Schottky contacts to be realized on comparison to needle like structures. en_ZA
dc.description.department Physics en_ZA
dc.description.embargo 2018-11-15
dc.description.librarian hj2017 en_ZA
dc.description.sponsorship The University of Pretoria and National Research Foundation (NRF), South Africa, Grant No: 91550 and 94166. en_ZA
dc.description.uri http://www.elsevier.com/locate/mssp en_ZA
dc.identifier.citation Mwankemwa, B.S., Nambala, F.J., Kyeyune, F., Hlatshwayo, T.T., Nel, J.M. & Diale, M. 2017, 'Influence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorods', Materials Science in Semiconductor Processing, vol. 71, pp. 209-216. en_ZA
dc.identifier.issn 1369-8001 (print)
dc.identifier.issn 1873-4081 (online)
dc.identifier.other 10.1016/j.mssp.2017.08.005
dc.identifier.uri http://hdl.handle.net/2263/62183
dc.language.iso en en_ZA
dc.publisher Elsevier en_ZA
dc.rights © 2017 Elsevier Ltd. All rights reserved. Notice : this is the author’s version of a work that was accepted for publication in Materials Science in Semiconductor Processing. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. A definitive version was subsequently published in Materials Science in Semiconductor Processing, vol. 71, pp. 209-216, 2017. doi : 10.1016/j.mssp.2017.08.005. en_ZA
dc.subject Zinc oxide nanostructures en_ZA
dc.subject Chemical bath deposition en_ZA
dc.subject Growth mechanism en_ZA
dc.subject Surface morphology en_ZA
dc.subject X-ray photoelectron spectroscopy en_ZA
dc.subject Electrical properties en_ZA
dc.subject Zinc oxide (ZnO) en_ZA
dc.title Influence of ammonia concentration on the microstructure, electrical and Raman properties of low temperature chemical bath deposited ZnO nanorods en_ZA
dc.type Postprint Article en_ZA


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