dc.contributor.author |
Petrashin, Pablo
|
|
dc.contributor.author |
Toledo, Luis
|
|
dc.contributor.author |
Lancioni, Walter
|
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dc.contributor.author |
Osuch, Piotr Jan
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dc.contributor.author |
Stander, Tinus
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dc.date.accessioned |
2017-06-05T06:50:49Z |
|
dc.date.available |
2017-06-05T06:50:49Z |
|
dc.date.issued |
2017 |
en |
dc.description.abstract |
Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between and , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed. |
en_ZA |
dc.description.department |
Electrical, Electronic and Computer Engineering |
en |
dc.description.sponsorship |
The Argentina-South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa. |
en |
dc.description.uri |
https://www.hindawi.com/journals/vlsi |
en |
dc.identifier.citation |
Petrashin, P., Toledo, L., Lancioni, W., Osuch, P. & Stander, T. 2017, 'Oscillation-based test applied to a wideband CCII', VLSI Design, vol. 2017, art. ID 5075103, pp. 1-6. |
en |
dc.identifier.issn |
1563-5171 (online) |
en |
dc.identifier.issn |
1065-514X (print) |
en |
dc.identifier.other |
10.1155/2017/5075103 |
en |
dc.identifier.uri |
http://hdl.handle.net/2263/60774 |
|
dc.language.iso |
English |
en |
dc.publisher |
Hindawi Publishing |
en |
dc.rights |
© 2017 Pablo Petrashin et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
en |
dc.subject |
Oscillation-based testing (OBT) |
en |
dc.subject |
VLSI test |
en |
dc.subject |
Second generation current conveyor (CCII) |
en |
dc.title |
Oscillation-based test applied to a wideband CCII |
en_ZA |
dc.type |
Article |
en |