Oscillation-based test applied to a wideband CCII

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dc.contributor.author Petrashin, Pablo
dc.contributor.author Toledo, Luis
dc.contributor.author Lancioni, Walter
dc.contributor.author Osuch, Piotr Jan
dc.contributor.author Stander, Tinus
dc.date.accessioned 2017-06-05T06:50:49Z
dc.date.available 2017-06-05T06:50:49Z
dc.date.issued 2017 en
dc.description.abstract Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between and , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed. en_ZA
dc.description.department Electrical, Electronic and Computer Engineering en
dc.description.sponsorship The Argentina-South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa. en
dc.description.uri https://www.hindawi.com/journals/vlsi en
dc.identifier.citation Petrashin, P., Toledo, L., Lancioni, W., Osuch, P. & Stander, T. 2017, 'Oscillation-based test applied to a wideband CCII', VLSI Design, vol. 2017, art. ID 5075103, pp. 1-6. en
dc.identifier.issn 1563-5171 (online) en
dc.identifier.issn 1065-514X (print) en
dc.identifier.other 10.1155/2017/5075103 en
dc.identifier.uri http://hdl.handle.net/2263/60774
dc.language.iso English en
dc.publisher Hindawi Publishing en
dc.rights © 2017 Pablo Petrashin et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. en
dc.subject Oscillation-based testing (OBT) en
dc.subject VLSI test en
dc.subject Second generation current conveyor (CCII) en
dc.title Oscillation-based test applied to a wideband CCII en_ZA
dc.type Article en


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