Oscillation-based test applied to a wideband CCII

dc.contributor.authorPetrashin, Pablo
dc.contributor.authorToledo, Luis
dc.contributor.authorLancioni, Walter
dc.contributor.authorOsuch, Piotr Jan
dc.contributor.authorStander, Tinus
dc.date.accessioned2017-06-05T06:50:49Z
dc.date.available2017-06-05T06:50:49Z
dc.date.issued2017en
dc.description.abstractOscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between and , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed.en_ZA
dc.description.departmentElectrical, Electronic and Computer Engineeringen
dc.description.sponsorshipThe Argentina-South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa.en
dc.description.urihttps://www.hindawi.com/journals/vlsien
dc.identifier.citationPetrashin, P., Toledo, L., Lancioni, W., Osuch, P. & Stander, T. 2017, 'Oscillation-based test applied to a wideband CCII', VLSI Design, vol. 2017, art. ID 5075103, pp. 1-6.en
dc.identifier.issn1563-5171 (online)en
dc.identifier.issn1065-514X (print)en
dc.identifier.other10.1155/2017/5075103en
dc.identifier.urihttp://hdl.handle.net/2263/60774
dc.language.isoEnglishen
dc.publisherHindawi Publishingen
dc.rights© 2017 Pablo Petrashin et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.en
dc.subjectOscillation-based testing (OBT)en
dc.subjectVLSI testen
dc.subjectSecond generation current conveyor (CCII)en
dc.titleOscillation-based test applied to a wideband CCIIen_ZA
dc.typeArticleen

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