Oscillation-based test in a CCII-based bandpass filter

Petrashin Pablo; Toledo, Luis; Lancioni, Walter; Osuch, Piotr Jan; Stander, Tinus

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dc.contributor	tinus.stander@up.ac.za	en_ZA
dc.contributor.author	Petrashin Pablo
dc.contributor.author	Toledo, Luis
dc.contributor.author	Lancioni, Walter
dc.contributor.upauthor	Osuch, Piotr Jan
dc.contributor.upauthor	Stander, Tinus
dc.date.accessioned	2017-03-06T08:22:08Z
dc.date.available	2017-03-06T08:22:08Z
dc.date.issued	2017-02
dc.description	Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.	en_ZA
dc.description.abstract	Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied to test Second-generation Current Conveyor (CCII) based filters for the first time. Adopting a CCII-based band pass filter as a case study, it is shown that OBT can be implemented with a minimally intrusive switched feedback loop to establish the oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short circuit and 100% detection of possible open circuit faults in the circuit under test, in both 0.35μm and 1.2μm CMOS technology nodes.	en_ZA
dc.description.librarian	hb2017	en_ZA
dc.description.sponsorship	The Argentina – South Africa Research Cooperation Programme, as administered by the Ministry of Science, Technology and Productive Innovation in Argentina and the National Research Foundation in South Africa.	en_ZA
dc.identifier.citation	Petrashin, PA, Toledo, LE, Lancioni, W , Stander, T & Osuch, PJ 2017, 'Oscillation-based test in a CCII-based bandpass filter', 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017, pp. 17-20.	en_ZA
dc.identifier.uri	http://hdl.handle.net/2263/59274
dc.language.iso	en	en_ZA
dc.publisher	Institute of Electrical and Electronics Engineers	en_ZA
dc.rights	© 2017 Institute of Electrical and Electronics Engineers	en_ZA
dc.subject	Continuous time filters	en_ZA
dc.subject	Analog testing	en_ZA
dc.subject	Fault simulation	en_ZA
dc.subject	Testing	en_ZA
dc.subject	Oscillation based testing (OBT)	en_ZA
dc.subject	Second-generation current conveyor (CCII)	en_ZA
dc.title	Oscillation-based test in a CCII-based bandpass filter	en_ZA
dc.type	Text	en_ZA