Oscillation based testing (OBT) has proven to be a
simple yet effective VLSI test for numerous circuit types. In this work,
OBT is applied to test Second-generation Current Conveyor (CCII)
based filters for the first time. Adopting a CCII-based band pass filter
as a case study, it is shown that OBT can be implemented with a
minimally intrusive switched feedback loop to establish the oscillator.
Exhaustive fault simulation indicates 98.11% detection of possible
short circuit and 100% detection of possible open circuit faults in the
circuit under test, in both 0.35μm and 1.2μm CMOS technology
Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.