Abstract:
Oscillation based testing (OBT) has proven to be a
simple yet effective VLSI test for numerous circuit types. In this work,
OBT is applied to test Second-generation Current Conveyor (CCII)
based filters for the first time. Adopting a CCII-based band pass filter
as a case study, it is shown that OBT can be implemented with a
minimally intrusive switched feedback loop to establish the oscillator.
Exhaustive fault simulation indicates 98.11% detection of possible
short circuit and 100% detection of possible open circuit faults in the
circuit under test, in both 0.35μm and 1.2μm CMOS technology
nodes.
Description:
Paper presented at the 8th Latin American Symposium on Circuits and Systems (LASCAS), Bariloche, Argentina, 20-23 February 2017.
