Abstract:
We report on an investigation carried out to determine effects of the probing beam on the structure of
typical metallic and insulating thin films during Elastic Recoil Detection Analysis (ERDA) using a heavy
ion beam. Metallic niobium nitride (NbN) and insulating calcium fluoride (CaF2) thin films (used as test
samples) were irradiated by 26.0 MeV 63Cu7+ ions to fluences of 1.70 1014 ions/cm2 and 2.70 1014
ions/cm2, respectively. The effects of irradiation on the structural properties of the films were studied
using Rutherford Backscattering Spectrometry (RBS), X-ray diffraction (XRD) and Atomic Force Microscopy
(AFM). RBS results showed a significant (18%) reduction in the thickness of the CaF2 film due to
electronic sputtering compared to only 1% reduction in the NbN film. XRD results showed no significant
peak shifts in both films, but rather formation of unidentified peaks in the insulating film. AFM results
indicated a substantial decrease in the average surface roughness of the insulating film and only a nominal
increase in that of the metallic film. Results of electronic sputtering yield measurements carried out
by ERDA are explained in terms of both the Coulomb explosion and the inelastic thermal spike models.
