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Showing 10 out of a total of 17 results for community: Natural and Agricultural Sciences.
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Current–temperature measurements of a SBD evaporated onto inductively coupled plasma cleaned germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of rare-earth implanted GaN
Janse van Rensburg, Pieter Johan
;
Auret, Francois Danie
;
Matias, V.S.
;
Vantomme, A.
(
Elsevier
,
2009
)
Radiation damage in ZnO ion implanted at 15 K
Wendler, E.
;
Bilani, O.
;
Gartner, K.
;
Wesch, W.
;
Hayes, M.
;
Auret, Francois Danie
;
Lorenz, K.
;
Alves, E.
(
Elsevier
,
2009
)
Electrical characterization of vapor-phase-grown single-crystal ZnO
Auret, Francois Danie
;
Goodman, Stewart Alexander
;
Legodi, Matshisa Johannes
;
Meyer, Walter Ernst
;
Look, D.C.
(
American Institute of Physics
,
2002-02-25
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS
Nyamhere, Cloud
;
Deenapanray, P.N.K.
;
Auret, Francois Danie
;
Farlow, F.C.
(
Elsevier
,
2006
)
Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Nyamhere, Cloud
;
Chawanda, Albert
;
Das, A.G.M.
;
Auret, Francois Danie
;
Hayes, M.
(
Elsevier
,
2007-12-15
)
Damage formation in Ge during Ar+ and He+ implantation at 15 K
Hayes, M.
;
Schroeter, A.
;
Wendler, E.
;
Wesch, W.
;
Auret, Francois Danie
;
Nel, Jacqueline Margot
(
Elsevier
,
2009
)
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Author
Auret, Francois Danie (17)
Janse van Rensburg, Pieter Johan (8)
Meyer, Walter Ernst (7)
Coelho, Sergio M.M. (6)
Hayes, M. (6)
Nel, Jacqueline Margot (5)
Nyamhere, Cloud (5)
Chawanda, Albert (4)
Das, A.G.M. (2)
Diale, M. (Mmantsae Moche) (2)
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Subject
Deep level transient spectroscopy (12)
Defects (8)
Diodes, Schottky-barrier (5)
DLTS (5)
Germanium (4)
Implantation (3)
Barrier height (2)
Electron beams (2)
Ge (2)
Germanium -- Defects (2)
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Date Issued
2009 (11)
2007 (3)
2006 (2)
2002 (1)
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true (17)