Electrical characterization of defects in heavy-ion implanted n-type Ge
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Date
Authors
Auret, Francois Danie
Janse van Rensburg, Pieter Johan
Hayes, M.
Nel, Jacqueline Margot
Coelho, Sergio M.M.
Meyer, Walter Ernst
Decoster, S.
Matias, V.S.
Vantomme, A.
Smeets, D.
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
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Description
Keywords
Implantation, Electronic defects
Sustainable Development Goals
Citation
Auret, FD, Janse van Rensburg, PJ, Hayes, M, Nel, JM, Coelho, S, Meyer, WE, Decoster, S, Matias, V, Vantomme, A & Smeets, D 2007, ‘Electrical characterization of defects in heavy-ion implanted n-type Ge’, Nuclear Instruments and Methods in Physics Research Section B : Beam Interactions with Materials and Atoms, vol.257, issues 1-2, pp. 169-171.[http://www.sciencedirect.com/science/journal/0168583X]