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Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Defect levels induced by double substitution of B and N in 4H-SiC
Igumbor, Emmanuel
;
Danga, Helga Tariro
;
Omotoso, Ezekiel
;
Meyer, Walter Ernst
(
Elsevier
,
2019-03
)
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Author
Auret, Francois Danie (1)
Danga, Helga Tariro (1)
Diale, M. (Mmantsae Moche) (1)
Igumbor, Emmanuel (1)
Legodi, Matshisa Johannes (1)
Meyer, Walter Ernst (1)
Omotoso, Ezekiel (1)
Tunhuma, Shandirai Malven (1)
Subject
Electrically active defects (2)
Silicon carbide (2)
Silicon compounds (2)
Capacitance (1)
Capacitance voltage measurements (1)
Charge state (1)
Conduction-band minimum (1)
Current voltage (1)
Deep-level transient spectroscopy (DLTS) (1)
Defect (1)
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2018 (1)
2019 (1)
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