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Browsing Electrical, Electronic and Computer Engineering by Author "Nel, Hendrik P."

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Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers

Nel, Hendrik P.; Dualibe, Fortunato Carlos; Stander, Tinus (Institute of Electrical and Electronics Engineers, 2023)

Please read abstract in the article.

Now showing items 1-1 of 1

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