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Showing 18 out of a total of 18 results for community: Physics.
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Current–temperature measurements of a SBD evaporated onto inductively coupled plasma cleaned germanium
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Paradzah, Alexander Tapera
;
Diale, M. (Mmantsae Moche)
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Ngoepe, Phuti Ngako Mahloka
(
Elsevier
,
2015-12
)
Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2018-07
)
Electrical characterization of defects introduced during metallization processes in n-type germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Janse van Rensburg, Pieter Johan
;
Nyamhere, Cloud
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of rare-earth implanted GaN
Janse van Rensburg, Pieter Johan
;
Auret, Francois Danie
;
Matias, V.S.
;
Vantomme, A.
(
Elsevier
,
2009
)
Electrical characterization of 5.4 MeV alpha-particle irradiated 4H-SiC with low doping density
Paradzah, Alexander Tapera
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Omotoso, Ezekiel
;
Diale, M. (Mmantsae Moche)
(
Elsevier
,
2015-09
)
Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
Omotoso, Ezekiel
;
Paradzah, Alexander Tapera
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Elsevier
,
2017-10
)
Electronic and annealing properties of the E0.31 defect introduced during Ar plasma etching of germanium
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Myburg, G.
;
Janse van Rensburg, Pieter Johan
;
Meyer, Walter Ernst
(
Elsevier
,
2009
)
Electrical characterization of defects introduced in n-type N-doped 4H-SiC during electron beam exposure
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Ngoepe, Phuti Ngako Mahloka
(
Trans Tech Publications
,
2016
)
Long range annealing of defects in germanium by low energy plasma ions
Archilla, J.F.R.
;
Coelho, Sergio M.M.
;
Auret, Francois Danie
;
Dubinko, V.I.
;
Hizhnyakov, V.
(
Elsevier
,
2015-03
)
Characterization of defects introduced in Sb doped Ge by 3keV Ar sputtering using deep level transient spectroscopy (DLTS) and Laplace-DLTS (LDLTS)
Nyamhere, Cloud
;
Das, A.G.M.
;
Auret, Francois Danie
;
Chawanda, Albert
;
Mtangi, Wilbert
;
Odendaal, R.Q. (Quintin)
;
Carr, Alan
(
Elsevier
,
2009
)
Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS
Nyamhere, Cloud
;
Deenapanray, P.N.K.
;
Auret, Francois Danie
;
Farlow, F.C.
(
Elsevier
,
2006
)
Thermal stability of Co, Ni, Pt or Ru Schottky contacts on n-Si and defects introduced thereon during contacts fabrication using electron beam deposition
Nyamhere, Cloud
;
Chawanda, Albert
;
Das, A.G.M.
;
Auret, Francois Danie
;
Hayes, M.
(
Elsevier
,
2007-12-15
)
Introduction and annealing of primary defects in proton-bombarded n-GaN
Schmidt, Matthias
;
De Meyer, Hannes
;
Jansen van Rensburg, P.J.
;
Meyer, Walter Ernst
;
Auret, Francois Danie
(
Wiley
,
2014-01
)
Electronic properties of defects in pulsed-laser deposition grown ZnO with levels at 300 and 370 meV below the conduction band
Auret, Francois Danie
;
Meyer, Walter Ernst
;
Janse van Rensburg, Pieter Johan
;
Hayes, M.
;
Nel, Jacqueline Margot
;
Von Wenckstern, Holger
;
Schmidt, H.
;
Biehne, G.
;
Hochmuth, H.
;
Lorenz, M.
;
Grundmann, Marius
(
Elsevier
,
2007-12
)
dc-Hydrogen plasma induced defects in bulk n-Ge
Nyamhere, Cloud
;
Venter, Andre
;
Murape, D.M.
;
Auret, Francois Danie
;
Coelho, Sergio M.M.
;
Botha, J.R.
(
Elsevier
,
2012-08
)
The fine structure of electron irradiation induced EL2-like defects in n-GaAs
Tunhuma, Shandirai Malven
;
Auret, Francois Danie
;
Legodi, Matshisa Johannes
;
Diale, M. (Mmantsae Moche)
(
American Institute of Physics
,
2016
)
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC
Omotoso, Ezekiel
;
Meyer, Walter Ernst
;
Coelho, Sergio M.M.
;
Diale, M. (Mmantsae Moche)
;
Ngoepe, Phuti Ngako Mahloka
;
Auret, Francois Danie
(
Elsevier
,
2016-08
)
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Auret, Francois Danie (18)
Meyer, Walter Ernst (9)
Coelho, Sergio M.M. (8)
Diale, M. (Mmantsae Moche) (6)
Janse van Rensburg, Pieter Johan (6)
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Deep level transient spectroscopy (7)
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Deep-level transient spectroscopy (DLTS) (4)
Germanium (4)
Irradiation (3)
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