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Showing 6 out of a total of 6 results for community: Physics.
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Effects of Ag and Sr dual ions implanted into SiC
Hlatshwayo, Thulani Thokozani
;
Mtshonisi, N.
;
Njoroge, Eric Gitau
;
Mlambo, Mbuso
;
Msimanga, M.
;
Skuratov, V.A.
;
O'Connell, J.H.
;
Malherbe, Johan B.
;
Motloung, Setumo Victor
(
Elsevier
,
2020-06
)
Influence of radiation damage on diffusion of fission products in silicon carbide
Friedland, Erich Karl Helmuth
;
Hlatshwayo, Thulani Thokozani
;
Van der Berg, Nic (Nicolaas George)
(
Wiley-Blackwell
,
2013
)
Influence of radiation damage on krypton diffusion in silicon carbide
Friedland, Erich Karl Helmuth
;
Hlatshwayo, Thulani Thokozani
;
Van der Berg, Nic (Nicolaas George)
;
Mabena, Chemist Mfanufikile
(
Elsevier
,
2015-07
)
Influence of radiation damage on xenon diffusion in silicon carbide
Friedland, Erich Karl Helmuth
;
Gärtner, K.
;
Hlatshwayo, Thulani Thokozani
;
Van der Berg, Nic (Nicolaas George)
;
Thabane, Tebello T.
(
Elsevier
,
2014-08
)
Effect of Xe ion (167 MeV) irradiation on polycrystalline SiC implanted with Kr and Xe at room temperature
Hlatshwayo, Thulani Thokozani
;
O’Connell, J.H.
;
Skuratov, V.A.
;
Msimanga, M.
;
Kuhudzai, J.K.
;
Njoroge, Eric Gitau
;
Malherbe, Johan B.
(
IOP Publishing
,
2015-10
)
Migration behaviour of Europium implanted into single crystalline 6H-SiC
Mohlala, T.M.
;
Hlatshwayo, Thulani Thokozani
;
Mlambo, Mbuso
;
Njoroge, Eric Gitau
;
Motloung, Setumo Victor
;
Malherbe, Johan B.
(
Elsevier
,
2017-07
)
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Hlatshwayo, Thulani Thokozani (6)
Friedland, Erich Karl Helmuth (3)
Malherbe, Johan B. (3)
Njoroge, Eric Gitau (3)
Van der Berg, Nic (Nicolaas George) (3)
Mlambo, Mbuso (2)
Motloung, Setumo Victor (2)
Msimanga, M. (2)
Skuratov, V.A. (2)
Gärtner, K. (1)
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Radiation damage (6)
Diffusion (4)
Silicon carbide (3)
Raman spectroscopy (2)
Rutherford backscattering spectrometry (RBS) (2)
Scanning electron microscopy (SEM) (2)
Silicon carbide (SiC) (2)
Transmission electron microscopy (TEM) (2)
Elastic recoil detection analysis (ERDA) (1)
Europium (Eu) (1)
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